Fundamentals of Metrology (FoM)5 ECTS
(Prüfungsordnungsmodul: Fundamentals of Metrology)

Lehrveranstaltungen:

• • Fundamentals of Metrology - Grundlagen der Messtechnik
    (Vorlesung, 2 SWS, Tino Hausotte, Di, 14:15 - 15:45, H8; Vorlesung statt Übung: 1. bis 2. Vorlesungswoche; weitere Verschiebungen werden in der Vorlesung und auf StudOn bekanntgegeben.)
  • Fundamentals of Metrology - Grundlagen der Messtechnik - Übung
    (Übung, 2 SWS, Tino Hausotte et al., Mi, 12:15 - 13:45, HH; Vorlesung statt Übung: 1. bis 2. Vorlesungswoche; weitere Verschiebungen werden in der Vorlesung und auf StudOn bekanntgegeben.)

Inhalt:

Basic principles

• Essence of measuring: SI unit system • Definitions of SI units (cd, K, kg, m, s, A, mol) • What is measuring? • Extensive and intensive quantities • Measuring, testing and gauging • Objective and subjective testing • Basic requirements for measuring • Transmission and use of the units • Correct use and notation of units • Measured value, true value, output value • Measurement deviations

• Principles and methods of measurement: Principles, methods and procedures of measurement • Deflection, differential, substitution and compensation measurement methods • Direct and indirect measurement methods • Analog and digital measurement methods • Absolute and incremental measurement methods • Resolution and sensitivity • Curve and kinds of curves

• Statistics – Evaluation of measurements series: Calculation of a measurement result based on measurement series • Basic terms of descriptive statistics • Presentation and interpretation of measured value distributions (histograms) • Frequency (absolute, relative, cumulative, relative cumulative) • Calculation and interpretation of basic parameters: location (mean, median, mode), dispersion (range, variance, standard deviation), shape (skewness and excess kurtosis) • Stochastics and distributions (rectangle, U and normal distribution) • statistical tests and statistical estimation methods • Correlation and regression

• Measurement errors and measurement uncertainty: Measured value, true value, conventional quantity value, detected value, output value • Influences on the measurement (Ishikawa diagram) • Measurement error (systematic, random) • Correction of known systematic measurement errors • Calibration, verification, legal verification • Measurement precision and accuracy • Repeatability conditions and precision , Comparison conditions and precision, extended comparison conditions and precision • Measurement uncertainty • Correct specification of a measurement result • Overview of standard method of the GUM (measurement uncertainty)
  

Mesurands of the SI system of units

• Measurement of electrical quantities: Measurement of current and voltage (current and voltage correct measurement), range adjustment • Wheatstone bridge circuit (quarter, half and full bridge, differential method and null balancing procedures) • Characteristic values of sinusoidal alternating quantities (alternating voltage bridge) • Operational Amplifier (Inverting amplifier, non-inverting amplifier, impedance converter) • Digitising chain (filters, sample-and-hold device, analog-digital conversion) • Variations in the analog-to-digital conversion

• Measurement of optical quantities: Light and properties of light • Photo detectors (photo resistors, photo diodes) • Sensitivity range of the eye • Radiometry and photometry • Luminous intensity (cd, candela) • Radiation laws

• Measurement of temperatures: Temperature, SI unit, definition • Heat transfer (conduction, convection, radiation) • Fixpoints (triple points, freezing points), fixpoint cells, International Temperature Scale (ITS-90) • Contact thermometers • Metal resistance thermometer, measurement circuits for resistance thermometers • Thermocouples, measurement circuits for thermocouples • Measurement errors of contact thermometers • Radiation laws, pyrometers (see optical quantities) • Measurement errors of pyrometers

• Time and Frequency: Time measurement • Atomic clock • Global Positioning System • Representation of time • Propagation of UTC • Frequency and phase angle measurement

• Length: Meter definition • Abbe comparator principle, errors 1st and 2nd order • Length measurement with linear encoders, motion direction, output signals, differential signals • Absolute coding (V-Scan and Gray code) • Interferometer, Michelson interferometer, basics of interference, homodyne principle, heterodyne principle, interference on homodyne interferometer, destructive and constructive interference, influence of air refractive index

• Angle and slope: plane angle, angle unit • material measures • angle measuring devices • slope measurement • optical angle measuring devices • measurement deviations • spatial angle, solid angle

• Mass and force: Definition of SI unit kilogram, mass standards, principle of mass dissemination • Definition of mass, force and torque • Measurement principles of weighing • Beam balance, spring balance, hanging and top pan balances, corner load sensitivity, DMS balance, EMC balance, mass comparators • Influences for mass determination • Force measurement, force measurement with DMS, Magneto-elastic and piezoelectric force measurement

Branches of industrial metrology

• Process Measurement Technology: Definition of pressure • Pressure types (absolute pressure, overpressure, differential pressure) • Pressure balance (piston manometer), U-tube manometer, bourdon pressure gauge, diaphragm pressure gauge • Pressure sensors (with DMS, piezoresistive, capacitive, piezoelectric) • Flow measurement (volume flow and mass flow, flow of fluids) • volumetric method, differential pressure method, sinker flow meter, magnetoinductive flowmeter, ultrasonic flow measurement • Mass flow rate measurement (Coriolis, thermal)

• Manufacturing Metrology: Subtasks of manufacturing metrology, objectives of manufacturing metrology • Form parameters of workpieces (micro-and macro-shape), structural error types, measuring, checking, monitoring • Comparison of classical measuring and coordinate measuring, standard geometrical features • Designs and basic structure of coordinate measuring machines • Procedure for measuring with a coordinate measuring machine

• Micro and Nanometrology: Demands of the microsystem technology on metrology • Sensors and probing systems of microsystem technology (tactile sensors, opto-tactile fiber probe, focus sensor, chromatic white light sensor) • Atomic force microscope (structure, working methods), scanning tunneling microscope • Nano coordinate measuring: 3-D realization of the Abbe comparator principle • Measures to reduce influences

Lernziele und Kompetenzen:

Objectives

• Basic knowledge of fundamentals of metrology, metrology activities, description of the characteristics of measuring instruments and measurement processes, International System of Units and traceability of measuring results.

• Basic knowledge of methodological and operational approach to tasks of measuring static mesurands, solving simple measurement tasks and determining measurement results from measured values.
  

Competencies

• Review of measuring instruments, measurement processes and measuring results and performing simple measurements of static variables.

Literatur:

• DIN e.V. (Hrsg.): Internationales Wörterbuch der Metrologie – Grundlegende und allgemeine Begriffe und zugeordnete Benennungen (VIM) ISO/IEC-Leitfaden 99:2007. Beuth Verlag GmbH, 3. Auflage 2010

• Hoffmann, Jörg: Handbuch der Messtechnik. 4. Auflage, Carl Hanser Verlag München, 2012 – ISBN 978-3-446-42736-5

• Lerch, Reinhard: Elektrische Messtechnik. 6. Auflage, Springer-Verlag Berlin Heidelberg, 2012 – ISBN 978-3-642-22608-3

• Richter, Werner: Elektrische Meßtechnik. 3. Auflage, Verlag Technik Berlin, 1994 - ISBN 3-341-01106-4

• Kohlrausch, Friedrich: Praktische Physik : zum Gebrauch für Unterricht, Forschung und Technik. Band 1-3, 24. Auflage, Teubner Verlag, 1996 – ISBN 3-519-23001-1, 3-519-23002-X, 3-519-23000-3

• Ernst, Alfons: Digitale Längen- und Winkelmesstechnik. 4. Auflage, Verlag Moderne Industrie, 2001 – ISBN 3-478-93264-5

• Pfeifer, Tilo: Fertigungsmeßtechnik. R. Oldenbourg Verlag München Wien, 1998 – ISBN 3-486-24219-9

• Keferstein, Claus P.: Fertigungsmesstechnik. 7. Auflage, Vieweg+Teubner Verlag, 2011 – ISBN 978-3-8348-0692-5

• Warnecke, H.-J.; Dutschke, W.: Fertigungsmeßtechnik. Springer-Verlag Berlin Heidelberg New York Tokyo, 1984 – ISBN 3-540-11784-9

Organisatorisches:

• Unterlagen zur Lehrveranstaltung werden auf der Lernplattform StudOn (www.studon.uni-erlangen.de) bereitgestellt. Das Passwort wird in der ersten Vorlesung bekannt gegeben.

Weitere Informationen:

Verwendbarkeit des Moduls / Einpassung in den Musterstudienplan:

1. International Production Engineering and Management (Bachelor of Science): 2. Semester
   (Po-Vers. 2011 | Grundlagen- und Orientierungsprüfung | Fundamentals of Metrology)

Studien-/Prüfungsleistungen:

Fundamentals of Metrology (Prüfungsnummer: 47701)

Prüfungsleistung, Klausur, Dauer (in Minuten): 60, benotet

Anteil an der Berechnung der Modulnote: 100.0 %

weitere Erläuterungen:

• Prüfungstermine, eine allgemeine Regel der Prüfungstagvergabe und Termine der Klausureinsicht finden Sie auf StudOn: Prüfungstermine und Termine der Klausureinsicht

  • Die Lehrveranstaltungen Grundlagen der Messtechnik [GMT] im Wintersemester und Fundamentals of Metrology [FoM] im Sommersemester sind inhaltlich identisch. Beide Lehrveranstaltungen werden bilingual (Vorlesungsunterlagen: englisch-deutsch, Vortragssprache: deutsch) gehalten.

• Die Prüfungen über Grundlagen der Messtechnik [GMT] (Prüfungnr. 45101) und Fundamentals of Metrology [FoM] (Prüfungnr. 47701) sind inhaltlich identisch. Die Aufgabenstellung der Prüfung über GMT ist nur in Deutsch, während die Aufgabenstellung der Prüfung über FoM bilingual (englisch-deutsch) ist.

Erstablegung: SS 2014, 1. Wdh.: WS 2014/2015

1. Prüfer:

Tino Hausotte

Termin: 24.07.2014, 16:00 Uhr, Ort: s. Aushang
Termin: 12.02.2015, 16:00 Uhr, Ort: K 1 TechF
Termin: 30.07.2015, 14:00 Uhr, Ort: H 11
Termin: 18.02.2016, 08:00 Uhr, Ort: H 8 TechF